refactor(vbus_monitor_test): Added test for test VBUS with self_powered flag

- Added test cases for USB OTG 1.1 (all targets)
- Added test cases for USB OTG 2.0 (esp32p4)
- Enabled the ci test for emulation of VBUS swithing on ESP32P4 USB OTG 2.0

Author: roma-jam

device/esp_tinyusb/test_apps/dconn_detection/main/test_dconn_detection.c

@@ -6,4 +6,4 @@ include($ENV{IDF_PATH}/tools/cmake/project.cmake)
 # "Trim" the build. Include the minimal set of components, main, and anything it depends on.
 set(COMPONENTS main)
 
-project(test_app_dconn_detection)
+project(test_app_vbus_monitor)

device/esp_tinyusb/test_apps/dconn_detection/pytest_dconn_detection.py

@@ -1,15 +1,19 @@
 /*
- * SPDX-FileCopyrightText: 2024 Espressif Systems (Shanghai) CO LTD
+ * SPDX-FileCopyrightText: 2024-2025 Espressif Systems (Shanghai) CO LTD
  *
  * SPDX-License-Identifier: Apache-2.0
  */
 
 #include <stdio.h>
 #include <string.h>
+#include "freertos/FreeRTOS.h"
+#include "freertos/task.h"
 #include "unity.h"
 #include "unity_test_runner.h"
 #include "unity_test_utils_memory.h"
 
+#include "test_vbus_monitor.h"
+
 void app_main(void)
 {
     /*
@@ -53,10 +57,16 @@ void app_main(void)
 void setUp(void)
 {
     unity_utils_record_free_mem();
+    test_device_event_queue_setup();
+    test_vbus_monitor_control_setup();
 }
 
 /* tearDown runs after every test */
 void tearDown(void)
 {
+    // Short delay to allow task to be cleaned up
+    vTaskDelay(10);
+    test_vbus_monitor_control_teardown();
+    test_device_event_queue_teardown();
     unity_utils_evaluate_leaks();
 }