Currently, when our track finding algorithms land on a new surface, they will select $N$ (a configuration parameter) measurements on that surface which meet a $\chi^2$ cut, but it makes this selection in whichever order the measurements are considered, which is essentially random. A better approach would be to select the $N$ best measurements as measured by their $\chi^2$ value.
The best way to implement this remains open for debate at this time.
Assigning myself, pinging @paradajzblond.
Currently, when our track finding algorithms land on a new surface, they will select$N$ (a configuration parameter) measurements on that surface which meet a $\chi^2$ cut, but it makes this selection in whichever order the measurements are considered, which is essentially random. A better approach would be to select the $N$ best measurements as measured by their $\chi^2$ value.
The best way to implement this remains open for debate at this time.
Assigning myself, pinging @paradajzblond.